- lateral force microscopy
- Semiconductors: LFM
Универсальный русско-английский словарь. Академик.ру. 2011.
lateral force microscopy
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Photoconductive atomic force microscopy — (pc AFM) is a scientific technique.. Multi layer photovoltaic cells have gained popularity since mid 1980s.[1] At the time, research was primarily focused on single layer photovoltaic (PV) devices between two electrodes, in which PV properties… … Wikipedia
Magnetic resonance force microscopy — (MRFM) is an imaging technique that acquires magnetic resonance images (MRI) at nanometer scales, and possibly at atomic scales in the future. MRFM is potentially able to observe protein structures which cannot be seen using X ray crystallography … Wikipedia
Microscopy — is the technical field of using microscopes to view samples and objects that cannot be seen with the unaided eye (objects that are not within the resolution range of the normal eye). There are three well known branches of microscopy, optical,… … Wikipedia
Friction force microscope — A friction force microscope is an atomic force microscope with a four quadrant photodetector, which allows measuring the frictional force acting on the probing tip sliding on a surface from the torsion of the cantilever beam where the tip is… … Wikipedia
Scanning probe microscopy — Part of a series of articles on Nanotechnology … Wikipedia
Magnetic force microscope — MFM images of 3.2 GB and 30 GB computer hard drive surfaces. Magnetic force microscope (MFM) is a variety of atomic force microscope, where a sharp magnetized tip scans a magnetic sample; the tip sample magnetic interactions are detected and used … Wikipedia
Kelvin probe force microscope — Kelvin probe force microscopy ( KPFM ), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM) that was [http://dns.ntu ccms.ntu.edu.tw/references/APPL PHYS LETT 58 2921 1991.pdf invented] in 1991.… … Wikipedia
Scanning capacitance microscopy — (SCM) is a variety of scanning probe microscopy in which a narrow probe electrode is held just above the surface of a sample and scanned across the sample. SCM characterizes the surface of the sample using information obtained from the change in… … Wikipedia
LFM — may refer to: * Looking for more. * Leaders for Manufacturing program at MIT Sloan School of Management * LFM Productions, a record label * Linear Frequency Modulation: signal modulation which produces a linear chirp * LFM an airflow velocity… … Wikipedia
LFM — abbr. Lateral Force Microscopy … Dictionary of abbreviations
Optical tweezers — (originally called single beam gradient force trap ) are scientific instruments that use a highly focused laser beam to provide an attractive or repulsive force (typically on the order of piconewtons), depending on the refractive index mismatch… … Wikipedia
